The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 22, 2008

Filed:

Jan. 21, 2003
Applicants:

Edward R. Dougherty, College Station, TX (US);

Yoganand Balagurunathan, College Station, TX (US);

Yidong Chen, Rockville, MD (US);

Inventors:

Edward R. Dougherty, College Station, TX (US);

Yoganand Balagurunathan, College Station, TX (US);

Yidong Chen, Rockville, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Simulating a microarray includes defining a number of parameters. A microarray is generated according to the parameters using an imaging procedure. The microarray is compared to a known value, and the imaging procedure is evaluated in response to the comparison. A simulated microarray image can be generated based on parameters. The simulated microarray can be associated with known values. An imaging procedure is applied to the simulated microarray image to generate observed values. The known values (e.g., intensities) can be compared to the observed values to evaluate the imaging procedure.


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