The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 22, 2008
Filed:
Apr. 27, 2005
Richard a Nygaard, Jr., Colorado Springs, CO (US);
Richard A Nygaard, Jr., Colorado Springs, CO (US);
Agilent Technologies, Inc., Santa Clara, CA (US);
Abstract
Eye diagrams are made for signals on each channel in a group thereof. Outlying signals that do not exhibit overlap for a sampling parameter that is to be common for all channels may be ignored and a warning given. Selected, normalized eye openings are used to discover optimum sampling parameters for each channel. Locations within each eye opening are ranked according to preference. Algorithms are used to select a single best value for a sampling parameter common to all the channels, and the corresponding best other sampling parameter is found for each channel. One algorithm disregards good choices for many channels to accommodate any remaining channel by using only a commonly agreed upon value (a jury system). Another algorithm gives weight to a choice according to the number of channels that agree on that choice (majority rule). A graphical user interface facilitates the selection, and emphasizes which sampling parameters are constrained to vary together.