The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 22, 2008
Filed:
Nov. 16, 2005
Frank Dubois, Brussels, BE;
Catherine Yourassowsky, Brussels, BE;
Frank Dubois, Brussels, BE;
Catherine Yourassowsky, Brussels, BE;
Abstract
The present invention is related to a compact microscope able to work in digital holography for obtaining high quality 3D images of samples, including fluorescent samples and relatively thick samples such as biological samples, said microscope comprising illumination means () at least partially spatially coherent for illuminating a sample () to be studied and a differential interferometer () for generating interfering beams from said sample () on the sensor () of an electronic imaging device(), said interferometer () comprising namely tilting means () for tilting by a defined angle one the interfering beams (or) relatively to the other, said tilting resulting into a defined shift () of said interfering beam on the sensor of the electronic imaging device (), said shift () being smaller than spatial coherence width of each beam, said microscope being able to be quasi totally preadjusted independently from the samples so that minimum additional adjustments are required for obtaining reliable 3D images of samples.