The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 22, 2008

Filed:

Nov. 17, 2005
Applicant:

Yosuke Okitsu, Kariya, JP;

Inventor:

Yosuke Okitsu, Kariya, JP;

Assignee:

DENSO CORPORATION, Kariya, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03K 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A control device for controlling a load drive semiconductor element for driving a load has a test operation mode for measuring a leak current of the load drive semiconductor element. In the test operation mode, a control terminal of the load drive semiconductor element is electrically separated from a power source or a ground by turning off another semiconductor element. Therefore, no electric current flows from the power source to the control terminal or from the control terminal to the ground. Therefore, the leak current of the load drive semiconductor element can be easily measured, even after the load drive semiconductor element is electrically connected to the control device for fabricating one-packaged IC.


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