The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 22, 2008
Filed:
Jun. 02, 2004
Robert O. Conn, Los Gatos, CA (US);
Steven J. Carey, San Jose, CA (US);
Siuki Chan, Cupertino, CA (US);
William H. Pabst, Palo Alto, CA (US);
Robert O. Conn, Los Gatos, CA (US);
Steven J. Carey, San Jose, CA (US);
Siuki Chan, Cupertino, CA (US);
William H. Pabst, Palo Alto, CA (US);
Xilinx, Inc., San Jose, CA (US);
Abstract
A system replicates the rapid temperature increases that are believed to cause microbump failures in certain applications of programmable logic devices (PLDs). The system configures a PLD under test with a circuit that switches a large amount of current and generates a large amount of heat when the circuit is clocked. The system monitors the temperature of the PLD and controls the switching of the circuit to achieve a predetermined temperature within a predetermined time period. The PLD is cooled, and the thermal cycling is repeated. The system detects microbump failures and communicates failure data to a computer for logging and analysis.