The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 22, 2008
Filed:
Jun. 29, 2005
Methods and apparatus for non-contact testing and diagnosing of open connections on non-probed nodes
Kenneth P. Parker, Ft. Collins, CO (US);
Myron J. Schneider, Ft. Collins, CO (US);
Kenneth P. Parker, Ft. Collins, CO (US);
Myron J. Schneider, Ft. Collins, CO (US);
Agilent Technologies, Inc., Santa Clara, CA (US);
Abstract
A method and apparatus for detecting open defects on non-probed node under test of an electrical device using capacitive lead frame technology is presented. In accordance with the method of the invention, a probed node neighboring the non-probed node under test is stimulated with a known source signal. A sensor of a capacitive sensing probe is capacitively coupled to at least the probed node and non-probed node under test of the electrical device, and a measuring device coupled to the capacitive sensing probe measures a capacitively coupled signal present between the sensor of the probe and at least the probed and non-probed node of the electrical device. Based on the value of the capacitively sensed signal, a known expected 'defect-free' capacitively sensed signal measurement and/or a known expected 'open' capacitively sensed signal measurement, a determination is made of whether an open defect exists on the non-probed node under test of the electrical device.