The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 22, 2008

Filed:

Feb. 15, 2006
Applicants:

Christian Stoller, Princeton Junction, NJ (US);

Michael Evans, Missouri City, TX (US);

Charles Flaum, Ridgefield, CT (US);

Inventors:

Christian Stoller, Princeton Junction, NJ (US);

Michael Evans, Missouri City, TX (US);

Charles Flaum, Ridgefield, CT (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01V 5/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

System and method for formation logging using a gamma-ray detector. The techniques including acquiring gamma-ray signals using the gamma-ray detector, the acquired gamma-ray signals having energies that span at least a first-energy region and a second-energy region, wherein the first-energy region includes energies higher than a selected threshold and the second-energy region includes energies lower than the selected threshold; determining interference signals based on the acquired gamma-ray signals in the first-energy region; and correcting the acquired gamma-ray signals in the second-energy region based on the interference signals to provide corrected gamma-ray signals.


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