The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 22, 2008
Filed:
Apr. 22, 2003
Claire Levrier, Rueil-Malmaison, FR;
Claude Cohen-bacrie, Manhattan, NY (US);
Nicholas Villain, Clamart, FR;
Jean-michel Lagrange, Moissy Cramayel, FR;
Robert R. Entrekin, Kirkland, WA (US);
Claire Levrier, Rueil-Malmaison, FR;
Claude Cohen-Bacrie, Manhattan, NY (US);
Nicholas Villain, Clamart, FR;
Jean-Michel Lagrange, Moissy Cramayel, FR;
Robert R. Entrekin, Kirkland, WA (US);
Koninklijke Philips Electronics, N.V., Eindhoven, NL;
Abstract
The invention relates to an ultrasound imaging system for forming an echographic image of a medium, which system includes a set [REC] of transducer elements [EL] which are operative in a transmission mode and in a reception mode for ultrasound waves, construction means [REB] for constructing echographic signals on the basis of signals [S[] . . . S[N]] received on the transducer elements [EL], display means [DIS] which are coupled to the construction means [REB] in order to display an image of the medium formed by means of the echographic signals. The construction means [REB] are such that in so-called exclusion zones, in which a coherent reflector is detected and which are determined by determination means [DET], the reception delays [D] are estimated in a manner [INT] other than that [CORR] used for the other zones. The calculation [CAL] of echographic signals is then carried out on the basis of the estimated delays [D[Z],Di[Z}}. The invention enables a correction of phase aberrations and nevertheless offers an excellent lateral resolution, notably in the case of point coherent reflectors.