The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 22, 2008

Filed:

Mar. 15, 2000
Applicants:

Hidetoshi Sugiyama, Hitachinaka, JP;

Katsuaki Takahashi, Hitachinaka, JP;

Hideyuki Yanami, Hitachinaka, JP;

Stephan Sattler, Starnberg, DE;

Inventors:

Hidetoshi Sugiyama, Hitachinaka, JP;

Katsuaki Takahashi, Hitachinaka, JP;

Hideyuki Yanami, Hitachinaka, JP;

Stephan Sattler, Starnberg, DE;

Assignee:

Roche Diagnostics Corp., Indianapolis, IN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B65G 59/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

An automatic analyzer, comprising disposable parts such as large quantities of nozzle tips and reaction containers for use in sample analysis inspection, wherein the part rack () holding unused parts is raised from a lowest position to a rack separation station (A) by a lift for supply () and separated so that only the uppermost stacked part rack can remain on the rack separation station, the separated part rack is moved to a part take-out station (B) where parts on the part rack are taken out one by one from a movable holding part (), and, by opening the floor part of the part take-out station (B) after part consumption, the used part rack is allowed to fall down and recovered on the lift () of a recovery lifter (), whereby the supply of an unused part rack on which unused parts are loaded and the recovery of a used part rack can be performed with a compact system configuration.


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