The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 22, 2008
Filed:
Jan. 24, 2006
Hisao Kikuta, Sakai, JP;
Kazuhiko Ohnuma, Sodegaura, JP;
Yasufumi Fukuma, Wako, JP;
Takashi Shioiri, Fujisawa, JP;
Hidetaka Aeba, Kita-ku, JP;
Hisao Kikuta, Sakai, JP;
Kazuhiko Ohnuma, Sodegaura, JP;
Yasufumi Fukuma, Wako, JP;
Takashi Shioiri, Fujisawa, JP;
Hidetaka Aeba, Kita-ku, JP;
Kabushiki Kaisha Topcon, Tokyo, JP;
Abstract
A fundus examination apparatus includes an illumination optical system (), which illuminates a fundus by fundus illumination light, an imaging optical system (), which photographs a fundus image based on a polarization property of reflected illumination light, and a picture signal processing device, which processes a signal output from the imaging optical system; and the imaging optical system includes a phase plate array () that a plurality of unit constitutional plates (U) is arranged in a matrix in a plane; each of the unit constitutional plates comprising four or more micro phase plates (-), a polarizer (), which polarizes the reflected illumination light passing through the phase plate array () into a predetermined polarization direction, and an image pickup device () that a plurality of constitutional units (U) is arranged in a matrix in a plane; each of the constitutional units comprising four or more pixels (G-G).