The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 22, 2008
Filed:
Mar. 28, 2005
Yoko Hirohara, Tokyo, JP;
Yoko Hirohara, Tokyo, JP;
Kabushiki Kaisha Topcon, Tokyo, JP;
Abstract
In an ophthalmological apparatus, how scattering at an eye under measurement and a contact lens affects how the eye sees is shown by measuring scattering when the contact lens is worn and by comparing a retinal image obtained with aberration and the scattering taken into account and a retinal image obtained with only the aberration taken into account. An aberration measurement section obtains the aberration of the eye under measurement. An other-components measurement section obtains other components other than the aberration component based on a point light-source image caused by each Hartmann plate. A scattering-level calculation section obtains a coefficient expressing the level of scattering based on the other components and the aberration. A simulation section generates a retinal image or data indicating how the eye under measurement sees with the measured aberration and the other components taken into account, based on the aberration and the coefficient.