The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 22, 2008
Filed:
Jul. 26, 2004
Hans Steinbichler, Neubeuern, DE;
Robert Wilhelm, Flintsbach, DE;
Bernd Leitner, Neubeuern, DE;
Roman Berger, Schnaitsee, DE;
Volker Rasenberger, Raubling, DE;
Rainer Huber, Piding, DE;
Hans Steinbichler, Neubeuern, DE;
Robert Wilhelm, Flintsbach, DE;
Bernd Leitner, Neubeuern, DE;
Roman Berger, Schnaitsee, DE;
Volker Rasenberger, Raubling, DE;
Rainer Huber, Piding, DE;
Steinbichler Optotechnik GmbH, Neubeuern, DE;
Abstract
A procedure serves for the testing of tires by means of a testing system. The testing system includes a memory in which geometric data () of the tire () are stored, and at least one probe () for testing the tire () surface. To improve on such a device, the probe or probes () are positioned with due consideration for the geometric data (-) of the tire () for the testing of the tire () surface (FIG.).