The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 22, 2008

Filed:

Dec. 03, 2003
Applicants:

Yoshiyuki Ishii, Shizuoka-ken, JP;

Hiroyuki Nishida, Shizuoka-ken, JP;

Inventors:

Yoshiyuki Ishii, Shizuoka-ken, JP;

Hiroyuki Nishida, Shizuoka-ken, JP;

Assignee:

Fujifilm Corporation, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B65B 1/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

A sorting and conveying line provided at an X-ray film cutting and collection operation includes a defective sheet gate, a collection gate and a sample gate for sorting X-ray film sheets, which have been cut to a predetermined size at a cutting section, while the X-ray film sheets are conveyed. Film detection sensors are disposed at entrance and exit sides of each of the defective sheet gate, the collection gate and the sample gate, and each film detection sensor detects the X-ray film sheet at times when the X-ray film sheet should be conveyed and sorted. Based on the results of detection, a determination is made as to whether or not there is any failure in control on a number of produced X-ray film sheets, and the like, as well as conveyance and sorting operations. This allows smooth and quick handling in the event of a failure.


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