The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 15, 2008
Filed:
Apr. 28, 2005
Thomas W. Sidle, Cupertino, CA (US);
Christian Stangier, Los Altos, CA (US);
Koichiro Takayama, Tokyo, JP;
Thomas W. Sidle, Cupertino, CA (US);
Christian Stangier, Los Altos, CA (US);
Koichiro Takayama, Tokyo, JP;
Fujitsu Limited, Kawasaki, JP;
Abstract
In one embodiment, a method for invariant checking includes executing one or more first steps of a finite state machine (FSM) corresponding to one or more binary decision diagrams (BDDs) to traverse a state space of the FSM in a first direction with respect to an initial state and an erroneous state. The method also includes, automatically and without user input, accessing a first profile corresponding to the one or more first steps of the FSM, comparing the first profile with one or more first predetermined criteria, stopping the traversal of the state space in the first direction according to the comparison between the first profile and the one or more first predetermined criteria, executing one or more second steps of the FSM to traverse the state space in a second direction with respect to the initial state and the erroneous state opposite the first direction according to a first partial result from the one or more first steps of the FSM, accessing a second profile corresponding to the one or more second steps of the FSM, comparing the second profile with one or more second predetermined criteria, stopping the traversal of the state space in the second direction according to the comparison between the second profile and the one or more second predetermined criteria, and executing one or more third steps of the FSM to traverse the state space in the first direction from the one or more first steps according to a second partial result from the one or more second steps of the FSM.