The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 15, 2008
Filed:
Oct. 25, 2005
Andreas Logisch, München, DE;
Mónica DE Castro Martins, München, DE;
Björn Flach, München, DE;
Wolfgang Ruf, Friedberg, DE;
Martin Schnell, München, DE;
Ana Leao, Oporto, PT;
Andreas Logisch, München, DE;
Mónica De Castro Martins, München, DE;
Björn Flach, München, DE;
Wolfgang Ruf, Friedberg, DE;
Martin Schnell, München, DE;
Ana Leao, Oporto, PT;
Infineon Technologies AG, , DE;
Abstract
A tester for semiconductor components with a plurality of channels is connected to a specific semiconductor component in order to characterize the signal path between tester and semiconductor component under production conditions. The specific semiconductor component includes measuring units that are connected to connection contacts and in each case provide the functionality of a signal generator, a signal detector, a digital communication interface and a receiving unit for trigger signals. The specific semiconductor component further includes a trigger logic to convey trigger signals between the receiving unit of a first one and the signal generator or detector of a second one of the measuring units.