The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 15, 2008

Filed:

Oct. 24, 2002
Applicants:

Mark A. Boike, Plano, TX (US);

Alan Phan, Rowlett, TX (US);

Brendon J. Slade, San Jose, CA (US);

Inventors:

Mark A. Boike, Plano, TX (US);

Alan Phan, Rowlett, TX (US);

Brendon J. Slade, San Jose, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An in-circuit emulation debugger and method of operating an in-circuit emulation debugger to test a digital signal processor (DSP). In one embodiment, the in-circuit emulation debugger includes: (1) a device emulation unit, coupled to a collocated DSP core, for emulating circuitry that is to interact with the DSP core, (2) an external processor interface, coupled to the device emulation unit, that receives control signals from an external processor that cause the device emulation unit to provide a test environment for the DSP core and (3) a breakpoint detection circuit, associated with the device emulation unit, that responds to preprogrammed breakpoints based on occurrences of events both internal and external to the DSP core.


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