The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 15, 2008
Filed:
Mar. 20, 2006
Atsushi Maki, Hachioji, JP;
Yuuichi Yamashita, Kawagoe, JP;
Tsuyoshi Yamamoto, Hatoyama, JP;
Hideaki Koizumi, Tokyo, JP;
Atsushi Maki, Hachioji, JP;
Yuuichi Yamashita, Kawagoe, JP;
Tsuyoshi Yamamoto, Hatoyama, JP;
Hideaki Koizumi, Tokyo, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
In order to provide an optical measurement system and an optical measurement method which is suitable for optically measuring a body to be inspected and easily obtaining an image of a desired item based on information obtained by the measurement, an optical measurement method including an initial display process for selectively instructing any one of selection of optical measurement, analysis of said optical measurement result and completion of a program; a process for inputting items of condition including a measurement mode; a process for displaying a light irradiation position and a light detection position and a state expressing measurement position relationship together with said mode; a process for instructing to form a file for storing said optical measurement result; a process for instructing a measurement condition to detect light signals from the inside of a body to be inspected which is irradiated by a multi-wavelength multi-channel; and a process for displaying said signals for each channel detected according to said instructed result.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile