The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 15, 2008
Filed:
Jan. 03, 2007
Michael E. Browne, Staatsburg, NY (US);
Andrew P. Wack, Millbrook, NY (US);
Monica J. Lemay, Austin, TX (US);
Derwin D. Gavin, Round Rock, TX (US);
Michael E. Browne, Staatsburg, NY (US);
Andrew P. Wack, Millbrook, NY (US);
Monica J. Lemay, Austin, TX (US);
Derwin D. Gavin, Round Rock, TX (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Disclosed are a method, information processing system and computer readable medium for performing a system test on a program. The method comprises creating a test plan associated with a system test. The system test is for testing a program within an environment. At least one test trigger to be monitored for during the system test is defined within the test plan. Execution of the system test on a system under test for the at least one test trigger is monitored. An occurrence of the at least one test trigger is determined. The test plan is modified to take into account the occurrence of the at least one test trigger in response to determining the occurrence. Execution of the system test is continued based on the modified test plan.