The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 15, 2008
Filed:
Oct. 22, 2003
Klaus Abraham-fuchs, Erlangen, DE;
Michael Moritz, Mistelgau, DE;
Klaus Abraham-Fuchs, Erlangen, DE;
Michael Moritz, Mistelgau, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
A method is proposed for carrying out quality control on an analytical process which belongs to a group of related analytical processes that can be executed in at least one analytical device and includes a respective chain of sub-processes. The method includes fundamental chemical and/or physical underlying sub-processes being stored for the group in a first database. Further, at least one section of the chain of the analytical process is emulated by the specification of one of the underlying sub-processes for each sub-process in a section of the chain, using at least one control parameter and at least one corresponding threshold value. Finally, measured values are determined for the control parameters for at least one run of the analytical process and the measured values are compared with the corresponding threshold values for the quality control procedure.