The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 15, 2008

Filed:

May. 25, 2004
Applicant:

Shigeyuki Ikeda, Chiba, JP;

Inventor:

Shigeyuki Ikeda, Chiba, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

An x-ray diagnostic imaging system with an x-ray irradiation unit for irradiating an object; an x-ray diaphragm unit for shielding the irradiated x-rays except for the x-rays irradiated on a portion used for obtaining an x-ray image of the object; an x-ray diaphragm setting unit for variably setting the portion to be shielded; an x-ray flat panel detector opposed to the x-ray irradiation unit via the object to be examined; an image processing unit for subjecting the x-ray image to an image processing; and a display unit displaying the x-ray image. The image processing unit includes a calculation unit reading out data of an x-ray detection element and calculating a line noise component from the read out data; and a line noise correction unit correcting a line noise of the x-ray image based on the line noise component calculated by the calculation unit.


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