The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 15, 2008

Filed:

Jun. 06, 2006
Applicants:

Shiro Oikawa, Kyoto, JP;

Hisanori Morita, Kyoto, JP;

Inventors:

Shiro Oikawa, Kyoto, JP;

Hisanori Morita, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An FPD has a detecting plane with detecting elements arranged in rows (u-axis) and columns (v-axis) extending in two intersecting axial directions. In time of primary scanning, the FPD is moved about a sectional axis to maintain the u-axis parallel to a body axis constantly. Consequently, in a reconstruction process, a set of projection points on the detecting plane of X rays having passed through lattice points in one row along the body axis A of an imaginary three-dimensional lattice, is parallel to the u-axis. It is therefore possible to derive all projection data that should be projected back to the lattice points in one row, only from detection signals acquired from the detecting elements in two lines having the set of projection points in between. Thus, the quantity of detection signals required for obtaining the projection data is reduced to perform the reconstruction process at high speed.


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