The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 15, 2008
Filed:
Nov. 07, 2005
Matthew D. Ebersole, Sun Prairie, WI (US);
Carla S. Draper, Madison, WI (US);
Jeffrey Hirsch, Madison, WI (US);
Matthew D. Ebersole, Sun Prairie, WI (US);
Carla S. Draper, Madison, WI (US);
Jeffrey Hirsch, Madison, WI (US);
Thermo Electron Scientific Instruments LLC, Madison, WI (US);
Abstract
An optical probe for use in infrared, near infrared, Raman, and other spectrometers includes a probe outer surface with a cavity defined therein. The probe emits light into a sample via emission locations on the probe outer surface, at least one being in the cavity. The light emitted into the sample is then collected at collection locations which include at least two of (a) a reflectance collection location situated on the probe outer surface for collecting diffusely reflected light from any adjacent sample; (b) a transmittance collection location situated in the cavity and receiving light transmitted across the cavity from an emission location situated on an opposite side of the cavity; and (c) a transflectance collection location situated in the cavity and receiving transflected light emitted from an emission location in the cavity, with such light being reflected from a side of the cavity opposite the transflectance collection location.