The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 15, 2008

Filed:

Sep. 30, 2003
Applicant:

Anthony J. Gounalis, Endicott, NY (US);

Inventor:

Anthony J. Gounalis, Endicott, NY (US);

Assignee:

Lockheed Martin Corporation, Bethesda, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 7/40 (2006.01); G01S 7/02 (2006.01); G01S 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method is provided for detecting emitter signals and for determining a scan strategy for a receiver system that receives such emitter signals. When detecting emitter signals of a particular emitter, the receiver may periodically revisit the portion of the frequency spectrum in which that emitter operates. The revisit time that the receiver uses for a particular emitter may dependent on certain characteristics of the emitter. One of these characteristics is the illumination time of the emitter. Some emitters may present more than one illumination time to a detecting receiver. This may occur, for example, if the emitter sweeps azimuth and changes its elevation angle. Thus, a system and method are provided for computing revisit times for emitters with multi-valued illumination times.


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