Process-insensitive self-biasing phase locked loop circuit and self-biasing method thereof

Abstract

A process-insensitive self-biasing PLL circuit and self-biasing method thereof prevent deterioration of loop stability even when there is a fabrication process variation. The self-biasing PLL circuit includes a phase frequency detector, a main charge pump circuit, an auxiliary charge pump circuit, a first operational amplifier, a second operational amplifier, a voltage-controlled oscillator, a divider, and a bias circuit. In the self-biasing PLL circuit, the first operational amplifier amplifies the voltage of a loop filter capacitor and the second operational amplifier serving as a regulator amplifies the output voltage of the first operational amplifier. The output voltage of the second operational amplifier is used as a control voltage of the voltage-controlled oscillator. Particularly, the bias circuit generates a first bias current using an NMOS transistor, generates a second bias current using a PMOS transistor, and sums up the first and second bias currents to generate a third bias current in response to the output voltage of the second operational amplifier. The first bias current is provided to the main charge pump circuit and the auxiliary charge pump circuit as their bias currents, and the third bias current is provided to the first operational amplifier as its bias current.