The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 15, 2008
Filed:
Mar. 29, 2006
Jong Dam Kim, Kyounggi-do, KR;
Hyun Kyu Lee, Seoul, KR;
Yong Jin Cho, Seoul, KR;
See Hwa Jeong, Kyounggi-do, KR;
Jong Dam Kim, Kyounggi-do, KR;
Hyun Kyu Lee, Seoul, KR;
Yong Jin Cho, Seoul, KR;
See Hwa Jeong, Kyounggi-do, KR;
LG. Philips LCD Co., Ltd., Seoul, KR;
Abstract
A method and apparatus for testing a liquid crystal display device are provided to detect a defect location precisely and rapidly without requiring a jig. The method includes providing an inspection apparatus as a removable portion of the liquid crystal display device; inspecting the display part of the liquid crystal display device using the inspection apparatus; removing the inspection apparatus from the liquid crystal display device after the inspection is completed; and attaching driving circuits to the liquid crystal display device having the inspection apparatus removed therefrom.