The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 15, 2008
Filed:
Jan. 20, 2006
Method, apparatus, and program for measuring an electromagnetic field and medium storing the program
Satoshi Kazama, Gunma, JP;
Masahiko Sakurada, Gunma, JP;
Hiroshi Tsutagaya, Gunma, JP;
Taiyo Yuden, Co., Ltd., Tokyo, JP;
Abstract
Provided is a method, apparatus and program for calculating an electric-field vector that allows for grasping the intensity, direction and phase of electric field on a scanning plane for an appliance, and a medium storing the program. An electric-field vector at an origin is calculated, based on potential-difference vectors in respective coordinate directions calculated depending upon a detected signal of at least a magnitude and phase of an electric-field component current by arranging a scanning electric-field sensor at an origin of a desired coordinate system established near an object-to-be-measured, signals detected at respective coordinates by sequential movement to desired coordinates on respective coordinate axes, and a detected reference signal of at least a magnitude and phase of a current by fixedly arranging a fixed magnetic-field sensor close to the object-to-be-measured, and distances between coordinates calculated based on the coordinates the scanning electric-field sensor is arranged and the origin.