The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 15, 2008

Filed:

Apr. 07, 2006
Applicants:

Bernhard Blümich, Roetgen, DE;

Federico Casanova, Aachen, DE;

Juan Perlo, Aachen, DE;

Inventors:

Bernhard Blümich, Roetgen, DE;

Federico Casanova, Aachen, DE;

Juan Perlo, Aachen, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A low-cost single-sided NMR sensor to produce depth profiles with microscopic spatial resolution is presented. The open geometry of the NMR sensor provides a non-invasive and non-destructive testing method to characterize the depth structure of objects of arbitrary size. The permanent magnet geometry generates one plane of constant magnetic field intensity parallel to the scanner surface. By combining the highly uniform static gradient with selective RF excitation, a thin flat sensitive slice can be defined. By moving the relative position between the slice and the object, one-dimensional profiles of the near surface of large samples are produced with high spatial resolution.


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