The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 15, 2008
Filed:
Feb. 28, 2006
Keith A. Clark, La Mesa, CA (US);
David E. Kresse, Walnut Creek, CA (US);
Brad Moyer, San Diego, CA (US);
Keith A. Clark, La Mesa, CA (US);
David E. Kresse, Walnut Creek, CA (US);
Brad Moyer, San Diego, CA (US);
GE Security, Inc., Bradenton, FL (US);
Abstract
An inspection system includes a housing having a cavity which defines an inspection zone, and a positioning device within the inspection zone which provides positioning of a specimen within the inspection zone. The inspection system includes a sensor system for inspecting the specimen, and an entrance aperture formed in the housing. The entrance aperture may be sized to permit the specimen to pass through the entrance aperture. The inspection system also includes a sealing mechanism, such as a door, which cooperates with the positioning device. The sealing mechanism is operatively coupled to the housing and selectively positionable between open and closed positions. The open position permits the specimen to pass through the entrance aperture, and the closed position seals the entrance aperture to effectively isolate the inspection system.