The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 15, 2008
Filed:
Mar. 01, 2007
Soshi Narishige, Hitachi, JP;
Akira Nishimizu, Tokai, JP;
Masahiro Koike, Hitachi, JP;
Yoshiharu Abe, Hitachi, JP;
Yuuichi Narumi, Hitachiohta, JP;
Hirofumi Ouchi, Hitachi, JP;
Soshi Narishige, Hitachi, JP;
Akira Nishimizu, Tokai, JP;
Masahiro Koike, Hitachi, JP;
Yoshiharu Abe, Hitachi, JP;
Yuuichi Narumi, Hitachiohta, JP;
Hirofumi Ouchi, Hitachi, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
An eddy current flaw detection sensor is provided which can detect a circumferential crack occurring at the deformed portion or peripheral portion thereof of a heat transfer tube with a high degree of sensitivity. Two excitation coilscause eddy current B to flow in the axial direction of a tubular test objectA detection coildisposed between the excitation coilsdetects bypass eddy current D which flows in the circumferential direction of the test objectwhile bypassing a circumferential crack E. For this purpose, the coil axes of the excitation coilsare directed to the radial direction of the cylindrical protection memberand the coil axis of the detection coilis directed to the axial direction of the protection member