The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 15, 2008

Filed:

Mar. 24, 2006
Applicants:

Kazunari Shimizu, Gamagori, JP;

Yukinobu Ban, Nishio, JP;

Toshiyuki Kawai, Toyohashi, JP;

Inventors:

Kazunari Shimizu, Gamagori, JP;

Yukinobu Ban, Nishio, JP;

Toshiyuki Kawai, Toyohashi, JP;

Assignee:

Nidek Co., Ltd., Aichi-ken, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

An eye refractive power measurement apparatus capable of checking a presenting position (presenting distance) of a fixation target. The eye refractive power measurement apparatus has a measurement optical system for measuring eye refractive power of an examinee's eye, a fixation target presentation optical system for presenting a fixation target to the examinee's eye, a changing unit which changes a presenting position of the fixation target in a direction of an optical axis of the presentation optical system, a display, and a controller which controls to display a change of the presenting position as a diopter change on the display graphically.


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