The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 15, 2008
Filed:
Nov. 27, 2002
Michael Roy Pokorny, Neenah, WI (US);
Douglas Gordon Barron Barber, Appleton, WI (US);
Perry A. Bush, Menasha, WI (US);
John Harland Hise, Neenah, WI (US);
Winnie Shi Mei Shun Hoo, Appleton, WI (US);
Charles Earl Markham, Appleton, WI (US);
Jon Ray Matheus, Appleton, WI (US);
Jamie Scott Mork, Greenville, WI (US);
Kurt Sigurd Nygaard, Appleton, WI (US);
Gregory Duncan Shaffer, Neenah, WI (US);
Jose Andres Stambuk, Appleton, WI (US);
Michael Roy Pokorny, Neenah, WI (US);
Douglas Gordon Barron Barber, Appleton, WI (US);
Perry A. Bush, Menasha, WI (US);
John Harland Hise, Neenah, WI (US);
Winnie Shi Mei Shun Hoo, Appleton, WI (US);
Charles Earl Markham, Appleton, WI (US);
Jon Ray Matheus, Appleton, WI (US);
Jamie Scott Mork, Greenville, WI (US);
Kurt Sigurd Nygaard, Appleton, WI (US);
Gregory Duncan Shaffer, Neenah, WI (US);
Jose Andres Stambuk, Appleton, WI (US);
Kimberly-Clark Worldwide, Inc., Neenah, WI (US);
Abstract
Integrating event-based production information with financial and purchasing systems in product manufacturing. Some of the disclosed embodiments include a method of tracking production information, a method of analyzing event-based production information to provide financial reports, a method of adapting an online production documentation system to provide financial report data, and a production documentation system. Also disclosed are computer-readable media for storing a data structure representing an event-based delay or waste record populated during manufacturing, and a method of automatically generating an alert and providing an associated financial report in a process for manufacturing a product associated with an event-based information system. The embodiments are operable in an intelligent manufacturing system including a process for converting raw materials to a product, a process control system including one or more sensors capable of generating an alarm in response to an event that results in one of waste, machine delay, or decrease product quality, a data logger associated with the process control system for obtaining event parameters associated with the event, a database on a server for recording event parameters obtained by the data logger, and a reporting system cooperatively associated with the database for reporting productivity parameters regarding the process derived at least in part from the event parameters.