The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 15, 2008

Filed:

Feb. 14, 2005
Applicant:

Andreas Noe, Kerken, DE;

Inventor:

Andreas Noe, Kerken, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 5/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and a surface evenness measuring roller for determining surface evenness measurement errors in steel and metal band comprising at least one measuring head having part measuring heads which part measuring heads are integrated respectively offset by 180° into the roller mantel and supported on two force transmitters and are further separated from the roller mantle by means of a circumferential motion gap and are braced with respect to one another by means of at least one tie rod wherein in the course of a measurement of the band tensile stress distribution over the whole band width the band with band is subject to tension over its whole band width wraps around the surface evenness measuring roller with a predetermined arc of contact and thereby exerts pressing forces onto the surface evenness measuring roller from which pressing forces can be determined the band tension distribution.


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