The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7356224 B1

PDF
Full Text
Expired
Date of Patent:
Apr. 08, 2008

Filed:

Jun. 27, 2003
Applicants:

Daniel Levner, Toronto, CA;

Martin F. Fay, Providence, RI (US);

Jingming Xu, Providence, RI (US);

Inventors:

Daniel Levner, Toronto, CA;

Martin F. Fay, Providence, RI (US);

Jingming Xu, Providence, RI (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 6/34 (2006.01);
U.S. Cl.
CPC ...
Abstract

Optical gratings that perform a number of functions at various wavelengths are formed by various methods that preserve spectral information within a wavelength band, the functions including: coupling radiation from one waveguide to another, controllable gratings that operate on different wavelengths in response to external control signals.


Find Patent Forward Citations

Levner, Daniel. (2008). Method and apparatus for detecting multiple optical wave lengths (U.S. Patent No. 7356224). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7356224

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…