The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 2008
Filed:
Dec. 05, 2003
Michael Fleisher, Sunnyvale, CA (US);
Sachin Ahuja, Mountain View, CA (US);
Adityo Prakash, Redwood Shores, CA (US);
Edward R. Ratner, Sunnyvale, CA (US);
Michael Fleisher, Sunnyvale, CA (US);
Sachin Ahuja, Mountain View, CA (US);
Adityo Prakash, Redwood Shores, CA (US);
Edward R. Ratner, Sunnyvale, CA (US);
Altera Corporation, San Jose, CA (US);
Abstract
One embodiment of the invention pertains to a method of determining a measure of image complexity. An image is subdivided the image into a plurality of small image regions. Multiple statistical tests are performed to determine the similarity of a pair of adjacent image regions. If said pair passes the multiple statistical tests, then the pair of adjacent image regions are grouped together into one new region. The resulting merged regions may be weighted according to geometry and/or color variance, and the weights may be summed to produce an image complexity measure.