The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 2008
Filed:
Oct. 24, 2005
Matthew B. Might, Atlanta, GA (US);
Mark A. Ferderer, Buford, GA (US);
Gary F. Bowser, Auburn, IN (US);
Matthew B. Might, Atlanta, GA (US);
Mark A. Ferderer, Buford, GA (US);
Gary F. Bowser, Auburn, IN (US);
ScanTech Holdings, LLC, Atlanta, GA (US);
Abstract
A non-intrusive inspection system, including apparatuses and methods, for non-intrusively inspecting containers such as, without limitation, those employed to transport items in international commerce. The non-intrusive inspection system is configured to generate and scan a container with multiple bremsstrahlung, or x-ray, beams having multiple spectra and directed at the container in multiple directions and planes separated by one or more angle(s). Using data collected from such scanning, software of the non-intrusive inspection system generates three-dimensional images of the items present in a container, calculates the volumes and densities of such items, computes effective 'Z' numbers, and distinguishes between multiple materials, or elements, of such items. By employing multiple bremsstrahlung beams directed upon a container in multiple planes, the non-intrusive inspection system reduces the number of orientations and geometries of items within a container that might otherwise be employed to avoid the detection of harmful materials being transported within a container.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile