The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 08, 2008

Filed:

Sep. 06, 2002
Applicants:

Joseph M. Fala, Honolulu, HI (US);

Luis A. Wills, Honolulu, HI (US);

Inventors:

Joseph M. Fala, Honolulu, HI (US);

Luis A. Wills, Honolulu, HI (US);

Assignee:

Spirent Communications Inc., Calabasas, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 3/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

Apparatuses and methods for testing the integrity of high speed optical fiber transmission networks are presented. Data from an optical network, for example, NRZ formatted data at forty gigabits per second and higher may be reliably recovered using embodiments of the invention. The invention employs hybrid microwave and high speed processing technology to reliably measure the phase shift of the data transmitted over a high speed optical transmission network by comparing the incoming data to a super-stable clock/frequency reference. The clock/frequency reference is intentionally offset by fractional frequency resulting in a beat frequency when compared to the incoming data. The beat frequency provides the ability for automatic calibration of the phase measurements because the period of the full 360 degrees phase is known. Also, the invention provides reliable means for measuring jitter and for generating Eye-pattern diagrams by eliminating issues associated with oscilloscope loop bandwidth limitations. Additionally, the phase of an incoming data and the time of the phase are available from measurements using high speed samplers.


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