The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 08, 2008

Filed:

Sep. 09, 2005
Applicant:

Gorden Videen, Silver Spring, MD (US);

Inventor:

Gorden Videen, Silver Spring, MD (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 4/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method and for analyzing dew in a system of interest are provided. A representative method comprises receiving infrared information corresponding to a degree of polarization of dew in a particular environment, and using the degree of polarization to determine dew presence in the environment. Changes in the degree of polarization can be attributed to changes in the density, size or shadowing of the dew drops. Infrared emissions information can be detected and accumulated over a range of emission angles and over a period of time. The system compares the accumulated data for the particular environment to detect the presence of dew, the rate of growth of the dew and the change in characteristics of dew over a period of time starting from a first time interval. The system also compares the accumulated data with other previous accumulated data from the environment to detect if changes should be made to the environment.


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