The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7355700 B1

PDF
Full Text
Expired
Date of Patent:
Apr. 08, 2008

Filed:

Nov. 03, 2005
Applicants:

Achim Kreckel, Mainz, DE;

Christian Laue, Mainz, DE;

Edgar Maehringer-kunz, Muenster-Sarmsheim, DE;

Inventors:

Achim Kreckel, Mainz, DE;

Christian Laue, Mainz, DE;

Edgar Maehringer-Kunz, Muenster-Sarmsheim, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An automated system for illuminating and inspecting the inner surface areas of tubular samples, especially stents, is disclosed. The system comprises rotatable means for receiving the sample to be inspected; at least one fluorescent surface area arranged in the immediate vicinity of the sample to be inspected; an UV-light source for illuminating the at least one fluorescent surface area; an electronic line-scan camera for inspecting the sample; and a computer based electronic imaging system, functionally connected to the camera, whereby the imaging system creates a line-by-line image of an area extending along the length of the sample as it rotates under the camera.


Find Patent Forward Citations

Kreckel, Achim. (2008). Automated inspection system and method (U.S. Patent No. 7355700). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7355700

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