The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 2008
Filed:
Apr. 24, 2006
Shishir Shah, Houston, TX (US);
Glenn F. Spaulding, Houston, TX (US);
Shishir Shah, Houston, TX (US);
Glenn F. Spaulding, Houston, TX (US);
Spin Diagnostics, Inc., Houston, TX (US);
Abstract
An imaging device and system for the high throughput imaging of multi-sample containers is described. Generally speaking, one or more containers capable of holding multiple sample volumes are fixed to a platform which is rotated during image acquisition operations. Images of sample volumes are obtained by moving an imaging device (e.g., a camera) from a first position to a second position across the one or more sample volumes. Because the platform is continuously rotated there is no lost time due to moving the samples (e.g., acceleration, deceleration and backlash compensation). Movement artifacts associated with motion of the imaging device occur in those times when the imaging device is 'between' sample volumes, thereby eliminating any lost time due to this motion. Rather than, or in combination with, the aforementioned lights sources, additional light sources may be added to provide epi-illumination.