The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 08, 2008

Filed:

Mar. 12, 2004
Applicants:

Junzhong Liang, Fremont, CA (US);

Dimitri Chernyak, Sunnvale, CA (US);

Kingman Yee, San Jose, CA (US);

Seema Somani, Milpitas, CA (US);

Jeffrey J. Persoff, San Jose, CA (US);

Walter Huff, Scotts Valley, CA (US);

Charles Campbell, Berkeley, CA (US);

Charles R. Munnerlyn, San Jose, CA (US);

Brian Bliven, San Jose, CA (US);

Inventors:

Junzhong Liang, Fremont, CA (US);

Dimitri Chernyak, Sunnvale, CA (US);

Kingman Yee, San Jose, CA (US);

Seema Somani, Milpitas, CA (US);

Jeffrey J. Persoff, San Jose, CA (US);

Walter Huff, Scotts Valley, CA (US);

Charles Campbell, Berkeley, CA (US);

Charles R. Munnerlyn, San Jose, CA (US);

Brian Bliven, San Jose, CA (US);

Assignee:

AMO Manufacturing USA, LLC, Santa Clara, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

A wavefront sensor enhances calibration of a laser ablation system, such as a laser eye surgery system, by measuring one or more characteristics of an ablated test surface. Typically, light is passed through the ablated test surface, and the light is analyzed to determine the test surface characteristics. In some embodiments, the ablated test surface is positioned along a treatment plane. In some embodiments, light is passed through a wavefront sensor, such as a Hartmann-Shack sensor, to convert the light into electrical signals. A processor then converts the electrical signals into data, such as surface maps showing high-order aberrations and/or artifacts on the test surface, refractive power measurements, shape measurements, and the like. Generated data may then be used to calibrate a laser surgery system.


Find Patent Forward Citations

Loading…