The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 2008
Filed:
Jul. 07, 2006
Klaus Mayer, Eckental, DE;
Cecile Mohr, Erlangen, DE;
Mike Müller, Möhrendorf, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
In a method for planning an examination of an examination subject in a magnetic resonance system, wherein images of different regions of the examination subject are acquired that are assembled into an overall image, the position of at least one first image in the examination subject, the measurement parameters for this at least one MR image are established, the position of at least one second image in the examination subject is determined, the measurement parameters for the at least one second image are established, and the measurement parameters that are dependent measurement parameters are determined. With these dependent measurement parameters the measurement parameters in the images are set (adjusted) such that they are identical for all images.