The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 08, 2008

Filed:

Dec. 28, 2006
Applicants:

Akira Okada, Tokyo, JP;

Junji Miyamoto, Okayama, JP;

Inventors:

Akira Okada, Tokyo, JP;

Junji Miyamoto, Okayama, JP;

Assignees:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 15/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

A current sensor that can reduce a measurement error due to isotropic elongation or strain owing to temperature and the like. A first half bridge circuit is placed in a first region divided by a center line of a mounting substrate, and a second half bridge circuit is placed in a second region, and the half bridge circuits are equally formed and placed point symmetrically about the central point of the mounting substrate. Even if elongation or strain occurs isotropically in the mounting substrate of magnetoresistive elements owing to temperature, the half bridge circuits undergo the influence of the elongation or strain equally as the bridge circuit. Thus, it can cancel the effect and reduce the measurement error due to the isotropic elongation or strain owing to temperature.


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