The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 2008
Filed:
May. 02, 2005
Naresh Menon, Pasadena, CA (US);
John D. Minelly, Bothell, WA (US);
Naresh Menon, Pasadena, CA (US);
John D. Minelly, Bothell, WA (US);
Other;
Abstract
A system and method for determining information about an assay. In one embodiment the method includes positioning a filter assembly, having an assay disposed on its surface, relative to a light source such that light from the light source is incident on the filter assembly and at least a portion of the light incident on the filter assembly is reflected from the filter assembly, illuminating the filter assembly with light from the light source, receiving light reflected from the filter assembly in an optical element, analyzing one or more characteristics of the light received in the optical element to determine information about a reaction in the assay, wherein a reaction in the assay results in a change of one or more characteristics of the light received from the filter assembly. In another embodiment, a system for analyzing an assay, comprises a structure in a resonating cavity configured to receive a filter assembly having an assay disposed on a first surface thereof such that the assay is positioned outside the resonating cavity, a light source positioned in the resonating cavity to communicate light to a second surface area of the filter assembly disposed in the resonating cavity, and an analysis system configured to receive light emitted from the filter assembly and detect information about a reaction in the assay based on one or more characteristics of the light.