The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 2008
Filed:
Oct. 06, 2003
Naoki Isogai, Nishio, JP;
Noriji Kawai, Gamagori, JP;
Yutaka Omori, Gamagori, JP;
Nidek Co., Ltd., , JP;
Abstract
An ophthalmic apparatus capable of checking the presence of abnormality such as soil on optical members and checking before examination whether or not the apparatus is in a state of being affected by disturbance light. The apparatus has a photo-receiving optical system, being arranged inside the apparatus and having optical members, for photo-receiving examination light reflected from the eye which is at an examination position outside the apparatus, a projection optical system, being arranged inside the apparatus and having a light source, for projecting detection light onto the optical member arranged nearest to the outside of the apparatus, a photodetector for photo-receiving reflected detection light when the light source is lit in a state where the eye is not placed at the examination position, and an abnormality detection device for detecting abnormality of the optical members based on an output signal from the photodetector.