The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 08, 2008

Filed:

Jul. 06, 2005
Applicants:

Silvio E. Kruger, Brossard, CA;

Guy Lamouche, Montréal, CA;

Daniel Lévesque, Lachenale, CA;

Jean-pierre Monchalin, Montréal, CA;

Inventors:

Silvio E. Kruger, Brossard, CA;

Guy Lamouche, Montréal, CA;

Daniel Lévesque, Lachenale, CA;

Jean-Pierre Monchalin, Montréal, CA;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 29/11 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system is disclosed for determining a property of an object by measuring ultrasonic attenuation. With the proposed method, a measured ultrasonic interaction signal of the object is compared with a reference signal produced using the same generation and detection setup, but using a reference part. The reference ultrasonic signal has low attenuation, and exhibits equivalent diffraction properties as the object, with respect to a broadband ultrasonic pulse. The difference is attributable to the attenuation of the object. The attenuation as a function of frequency, the attenuation spectrum, is fitted to a model to obtain a parameter useful for identifying one of the many properties of an object that varies with ultrasonic attenuation.


Find Patent Forward Citations

Kruger, Silvio. (2008). Method and system for determining material properties using ultrasonic attenuation (U.S. Patent No. 7353709). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7353709

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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