The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 2008
Filed:
Jul. 06, 2005
Silvio E. Kruger, Brossard, CA;
Guy Lamouche, Montréal, CA;
Daniel Lévesque, Lachenale, CA;
Jean-pierre Monchalin, Montréal, CA;
Silvio E. Kruger, Brossard, CA;
Guy Lamouche, Montréal, CA;
Daniel Lévesque, Lachenale, CA;
Jean-Pierre Monchalin, Montréal, CA;
National Research Council of Canada, Ottawa, Ont., CA;
Abstract
A method and system is disclosed for determining a property of an object by measuring ultrasonic attenuation. With the proposed method, a measured ultrasonic interaction signal of the object is compared with a reference signal produced using the same generation and detection setup, but using a reference part. The reference ultrasonic signal has low attenuation, and exhibits equivalent diffraction properties as the object, with respect to a broadband ultrasonic pulse. The difference is attributable to the attenuation of the object. The attenuation as a function of frequency, the attenuation spectrum, is fitted to a model to obtain a parameter useful for identifying one of the many properties of an object that varies with ultrasonic attenuation.