The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 2008
Filed:
May. 25, 2006
Takashi Matsumoto, Kariya, JP;
Yasuo Niino, Hoi-gun, JP;
Toshiyuki Okita, Nishio, JP;
Yoshiji Yamamoto, Toyohashi, JP;
Takashi Matsumoto, Kariya, JP;
Yasuo Niino, Hoi-gun, JP;
Toshiyuki Okita, Nishio, JP;
Yoshiji Yamamoto, Toyohashi, JP;
JTEKT Corporation, Osaka-shi, JP;
Abstract
A shape measuring instrument is provided as being capable of measuring a surface shape of a target with a small contact force while changing the contact force. A measuring probeis supported while a tilt θ is provided. A retracting force of the measuring forceis produced by the tilt θ, and thus, is obtained as mgsig θ which is much small as compared with a self weight 'm'. On the other hand, biasing is provided with an extruding force Fc by means of an air cylinder. Thus, a contact force of the measuring proberelevant to a work piece W is obtained as a difference between a measuring probe self weight tilt component mgsigθ and the extruding force Fc of the air cylinder(F=Fc−mgsigθ), thus making it possible to reduce a contact force to be very small.