The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 2008
Filed:
May. 02, 2005
Akira Ioku, Tokyo, JP;
Motoaki Satoyama, Sagamihara, JP;
Tatsuo Isobe, Yokohama, JP;
Koji Doi, Yokohama, JP;
Minoru Koizumi, Tokyo, JP;
Akira Ioku, Tokyo, JP;
Motoaki Satoyama, Sagamihara, JP;
Tatsuo Isobe, Yokohama, JP;
Koji Doi, Yokohama, JP;
Minoru Koizumi, Tokyo, JP;
Hitachi Software Engineering Co., Ltd., Yokohama-Shi, JP;
Abstract
In a method for testing a program, repeated measurement on branches that are frequently taken is prevented, thereby avoiding unnecessary overhead. An information processing device includes a coverage measurement control program for determining whether the number of times an instruction of a measurement target program has been executed due to execution of the measurement target program is equal to or larger than the maximum allowable number of measurements set for the instruction; and a coverage measurement program for incrementing a value in a field for the instruction by one to indicate the number of times the instruction has been executed, the coverage measurement program being called if the number of times the instruction has been executed is smaller than the maximum allowable number of measurements.