The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 2008
Filed:
May. 06, 2005
Patrick A. Owsley, Moscow, ID (US);
Brian A. Banister, Pullman, WA (US);
Tom Hansen, Pullman, WA (US);
Patrick A. Owsley, Moscow, ID (US);
Brian A. Banister, Pullman, WA (US);
Tom Hansen, Pullman, WA (US);
Comtech AHA Corporation, Moscow, ID (US);
Abstract
The current invention involves a forward error detection system, especially for use with Low Density Parity Check codes. A parallel SISO structure allows the decoder to process multiple parity equations at the same time. There is a new SISO decoder which allows for the updating of the Log-likelihood-ratios in a single operation, as opposed to the two pass traditionally associated with the Tanner Graphs. In the decoder, there is a mapping structure that correctly aligns the stored estimates, the stored differences and the SISOs. There is also the ability to deal with multiple instances of the same data being processed at the same time. This structure manages the updates and the differences in such a manner that all calculations on a single piece of data that are processed in parallel are incorporated correctly in the new updated estimates.