The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 2008
Filed:
Nov. 25, 2003
Nisha D. Talagala, Livermore, CA (US);
Brian Wong, Gordonsville, VA (US);
Nisha D. Talagala, Livermore, CA (US);
Brian Wong, Gordonsville, VA (US);
Sun Microsystems, Inc., Santa Clara, CA (US);
Abstract
A protection domain for a set of errors is defined using an association between data and first integrity metadata to protect data traversing an input/output datapath. The datapath has a storage device as one endpoint and a first generation integrity point for a host as an opposite endpoint. A first sub-domain is defined within the protection domain using an association between the data and second integrity metadata to further protect a portion of the datapath having a second generation integrity point as one endpoint. In another aspect, a second sub-domain is defined within the protection domain using an association between the data and third integrity metadata further protect data traversing a portion of the datapath having a third generation integrity point as one endpoint. The first and second sub-domains are nested within the protection boundary and may be in a hierarchical relationship.