The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 01, 2008

Filed:

Aug. 21, 2006
Applicants:

Leoncio D. Lopez, Escondido, CA (US);

David K. Mcelfresh, San Diego, CA (US);

Dan Vacar, San Diego, CA (US);

Kenny C. Gross, San Diego, CA (US);

Inventors:

Leoncio D. Lopez, Escondido, CA (US);

David K. McElfresh, San Diego, CA (US);

Dan Vacar, San Diego, CA (US);

Kenny C. Gross, San Diego, CA (US);

Assignee:

Sun Microsystems, Inc., Santa Clara, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system that detects the onset of degradation for interconnections in a component within a computer system. During operation, the system monitors inferential variables associated with the interconnections during operation of the computer system. Next, the system determines a present state of the component from the monitored inferential variables. The system then compares the present state of the component with an initial state of the component. If the comparison indicates that the interconnections in the component have reached or will reach a limited operating state (LOS), the system performs a remedial action.


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